1,000,000x Magnification Schottky Field Emission Scanning Electron Microscope (SEM) I Meubon MA637040

Schottky Field Emission Scanning Electron Microscope (SEM), 1,000,000x Magnification

The MA637040 is a cutting-edge analytical thermal field emission scanning electron microscope, designed for high-resolution imaging and precise analysis. Equipped with a high-brightness Schottky field emission electron gun, this microscope ensures long-lasting performance and exceptional clarity. The innovative three-stage magnetic lens design provides a large, continuously adjustable beam current, making it ideal for applications such as EDS (Energy Dispersive Spectroscopy), EBSD (Electron Backscatter Diffraction), and WDS (Wavelength Dispersive Spectroscopy).

The microscope supports low vacuum mode, allowing for the direct observation of weakly conductive or non-conductive samples. Its standard optical navigation mode and intuitive user interface simplify complex analyses, making it easier and more efficient.

Key Specifications:

• Resolution:
  • 1.0nm @15kV (SE)
  • 1.5nm @1kV (SE)
  • 0.8nm @30kV (STEM)
  • 1.0nm @30kV (SE)
  • 0.9nm @30kV (STEM)
• Voltage: 20V to 30kV / 0.2kV to 30kV
• Magnification: 1x to 1,000,000x
• Electron Gun: Schottky Field Emission Electron Gun with in-cylinder deceleration and electromagnetic composite objective, water-cooled thermostatic objective.
• Vacuum System: Fully automatic oil-free vacuum control
  • Electron Gun: <9x10⁻⁸ Pa
  • Sample Chamber: <5x10⁻⁴ Pa
• Vacuum Pump:
  • Mechanical pump: >6m³/h
  • Turbo molecular pump: >240 L/S
  • Ion pump: >25 L/S (x2)
• Working Stage: 5-Axis Auto Stage (X: 120mm, Y: 115mm, Z: 50mm, Tilt: -10° to +90°, Rotation: 360°)
• Camera: Vertical Optical Navigation CCD, Horizontal Monitoring CCD
• Detector: Secondary Electron Detector (ETD), High-Angle Electron Detector (Inlens)
• Software: SEM Operation Software (Chinese/English), Multi-Channel Display, Optical Navigation, Gesture Navigation, Auto Brightness/Contrast, Auto Focus, Auto Astigmatism. Supports TIFF, JPG, BMP, PNG image formats.
• Computer: Workstation with 16GB Memory, 512GB Hard Disk, 24" Monitor, Windows 10 OS
• Installation Requirements: Room dimensions L>3000mm, W>4000mm, H>2300mm; Temperature 20~25℃, Humidity <50%
• Power Supply: AC 220V (±10%), 50Hz, 2 kVA

Optional Accessories:

• BSE Detector
• EDS Detector
• EBSD Detector
• STEM Detector (9-quadrant, 80mm²)
• EBIC and CL Detectors
• Knob Control Panel & Trackball
• Sample Exchange Chamber
• Beam Gate & Electron Beam Exposure
• Large Size Image Stitching Software

This SEM is a powerful tool for detailed material analysis, offering flexibility and precision for advanced research and industrial applications.